allow test firmware to mark test as failed
also rewrite most of the stlink implementation to not reuse connections and halt the devices after running tests.

also rewrite most of the stlink implementation to not reuse connections and halt the devices after running tests.
2024-12-01 07:48:16 +01:00 · 2024-11-23 21:24:12 +01:00 · 2024-11-18 04:54:04 +01:00 · 2024-12-01 07:48:16 +01:00 · 2024-12-01 07:48:16 +01:00 · 2024-11-23 03:40:26 +01:00
diff --git a/Rafael G. Martins b/Rafael G. Martins
Filename	Latest commit message	Latest commit date
Rafael G. Martins db59c7a644 allow test firmware to mark test as failed also rewrite most of the stlink implementation to not reuse connections and halt the devices after running tests.		2024-12-01 07:48:16 +01:00
.vscode	runner: reimplement in golang	2024-11-23 21:24:12 +01:00
3d-models	Initial commit	2024-11-18 04:54:04 +01:00
common	allow test firmware to mark test as failed	2024-12-01 07:48:16 +01:00
firmware	allow test firmware to mark test as failed	2024-12-01 07:48:16 +01:00
pcb	pcb: revision 20241120: fixed conflict of LED pins with VCP pins	2024-11-23 03:40:26 +01:00
runner	allow test firmware to mark test as failed	2024-12-01 07:48:16 +01:00
.gitignore	runner: reimplement in golang	2024-11-23 21:24:12 +01:00
LICENSE	Initial commit	2024-11-18 04:54:04 +01:00
README.md	runner: initial code, no actual tests yet	2024-11-19 02:00:15 +01:00